发明名称 METHOD FOR MEASURING REFRACTION CHARACTERISTICS OF LENS AND LENS METER THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a method for measuring the refraction characteristics of a lens, and a lens meter therefore, in which a position under actual measurement or a position where measurement has ended can be known easily when the refraction characteristics of a lens are measured at a large number of positions without using any dedicated machine. SOLUTION: When a lens L being inspected is moved in a direction substantially orthogonal to a measuring optical axis O, coordinate Si of the measuring position of the lens L being inspected by a measuring light beam is determined by an operation control circuit 13 processing means every predetermined time or at a predetermined interval and a refraction characteristics value is determined at the coordinate Si of the lens L being inspected by the operation control circuit 13. Bars Bi indicative of the refraction characteristics are displayed sequentially and additionally at the coordinate Si of positions where measurement has ended on the screen 2a of a display 2.
申请公布号 JP2002022605(A) 申请公布日期 2002.01.23
申请号 JP20000209294 申请日期 2000.07.11
申请人 TOPCON CORP 发明人 KOBAYASHI SHINICHI;KATO TAKEYUKI
分类号 G01M11/02;(IPC1-7):G01M11/02 主分类号 G01M11/02
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