发明名称 Method to deposit SiOCH films with dielectric constant below 3.0
摘要 A chemical vapor deposition (CVD) process uses a precursor gas, such as with a siloxane or alkylsilane, and a carbon-dioxide-containing gas, such as CO2 with O2 or CO2 with CxH(2x+1)OH where 1<=x<=5, to deposit a dielectric layer with no photoresist "footing", a low dielectric constant, and high degrees of adhesion and hardness. Because nitrogen is not used in the deposition process (the carbon-dioxide-containing gas replaces nitrogen-containing gases in conventional processes), amines do not build into the deposited layer, thereby preventing photoresist "footing".
申请公布号 US6340628(B1) 申请公布日期 2002.01.22
申请号 US20000735318 申请日期 2000.12.12
申请人 NOVELLUS SYSTEMS, INC. 发明人 VAN CLEEMPUT PATRICK A.;LAXMAN RAVI KUMAR;SHU JEN;SCHULBERG MICHELLE T.;NIE BUNSEN
分类号 C23C16/30;H01L21/316;(IPC1-7):H01L21/320;H01L21/31 主分类号 C23C16/30
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