发明名称 Integrity tester for parallel signal bus
摘要 A parallel data bus tester is particularly applicable to SCSI type buses, and uses a plurality of comparator circuits to simultaneously examine the voltages present on the conductors of a bus cable. For twisted pair type conductors, the tester uses a high reference voltage, which is compared to the high voltage conductor of each pair, and a low reference voltage, which is compared to the low voltage conductor of each pair. The reference voltages are adjustable, and allow each reference voltage to be swept through the expected voltage range for its respective conductors. As the level of a reference voltage crosses that of a conductor voltage being examined, a comparator that receives the reference voltage and conductor voltage changes output state. This output is used to drive a corresponding LED assigned to the conductor in question. Thus, as the reference voltage, which is compared to each of its corresponding conductor voltages (i.e., high or low), is swept through the voltage range of those conductors, the LEDs for each conductor turn on. If any of the LEDs turns on at a significantly different voltage level than the others, it indicates a potential problem with that conductor. Latch circuits for each of the comparator outputs are also provided, allowing intermittent errors to be recorded.
申请公布号 US6341358(B1) 申请公布日期 2002.01.22
申请号 US19980152824 申请日期 1998.09.14
申请人 COMPAQ COMPUTER CORPORATION 发明人 BAGG CHARLES;HAM WILLIAM
分类号 H04L12/26;(IPC1-7):H02H3/05 主分类号 H04L12/26
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