发明名称 Defective area replacement method and information writing/reading device
摘要 A method of replacement processing for secondary defects is provided that can maintain both the transfer rate and quality of write/read data at high levels. According to the method, a change-permitted range in which changes in the assignment of logical addresses is allowed is acquired, and when sectors having secondary defects due to write abnormalities are detected, replacement of sectors is carried out as long as changes in the assignment of logical addresses do not go beyond sectors in the change-permitted range by: omitting the secondary defect sectors by additionally registering the defective sectors in a slip replacement list, and shifting back the assignment of logical addresses as long as there are free sectors following the abnormal sectors.
申请公布号 US6341109(B1) 申请公布日期 2002.01.22
申请号 US20000497410 申请日期 2000.02.03
申请人 NEC CORPORATION 发明人 KAYANUMA KINJI
分类号 G11B20/10;G11B20/12;G11B20/18;(IPC1-7):G11B7/00 主分类号 G11B20/10
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