发明名称 Shaking test apparatus and method for structures
摘要 A shaking response is estimated with high precision by performing a shaking test f or combining and estimating a shaking characteristic of a partial structure of an object under test obtained through a shaking test and a shaking response of the whole structure which is numerically modeled. In a shaking test apparatus and method, a structure under test comprises a partial structure and a numerical model which is virtually connected to the partial structure. First, a vibration model corresponding to the partial structure is assumed, the numerical model and the vibration model are combined to construct an overall-system model, and then the vibration response of the overall-system model is calculated. On the basis of the calculation result and the signal input from a waveform oscillator, the partial structure is shaken by using a shaker. The displacement and reaction force of the partial structure are measured by a displacement gauge and a load cell, the vibration model is corrected on the basis of the measurement value and the overall-system model is reconstructed. This procedure is repeated to construct the overall-system model with high precision.
申请公布号 US6341258(B1) 申请公布日期 2002.01.22
申请号 US20000526207 申请日期 2000.03.15
申请人 HITACHI, LTD. 发明人 INOUE MASAHIKO;HORIUCHI TOSHIHIKO;MOMOI YASUYUKI;KONNO TAKAO;YAMAGISHI WATARU
分类号 G01M7/02;(IPC1-7):G01M7/02 主分类号 G01M7/02
代理机构 代理人
主权项
地址