APPARATUS FOR REMOVING POGO PIN OF APPARATUS FOR TESTING SEMICONDUCTOR

摘要

PURPOSE: An apparatus for removing a pogo pin of an apparatus for testing a semiconductor is provided to prevent the pogo pin from being warped or damaged, by easily removing the pogo pin regardless of the pogo pin used in an electrical die sorting(EDS) test. CONSTITUTION: A passing hole(20) is formed inside a main body(10). A spring(12) is installed in the upper portion of the main body. A handler(14) is installed in the end of the lower portion of the spring, crossing the center of the passing hole of the main body. A shaft(16) is coupled to the center of the handler along the passing hole of the main body. Pincers(18) are coupled to the lower portion of the shaft.