发明名称 THERMAL PROCESSING SYSTEM AND METHODS FOR FORMING LOW-K DIELECTRIC FILMS SUITABLE FOR INCORPORATION INTO MICROELECTRONIC DEVICES
摘要 <p>Single wafer processing methods and systems for manufacturing films having low-k properties and low indices of refraction. The methods incorporate a processing station in which both curing and post-cure, in situ gas cooling takes place.</p>
申请公布号 WO2002004134(A1) 申请公布日期 2002.01.17
申请号 US2001021927 申请日期 2001.07.11
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