发明名称 Method of fabricating semiconductor device equipped with capacitor portion
摘要 In fabricating a capacitor portion of a semiconductor device, after forming an upper electrode, a resist pattern for forming a lower electrode is formed and etching processing of an insulating film layer and a first metal layer is carried out. Thus, the lower electrode and a wiring pattern can simultaneously be formed by etching the insulating film layer and the first metal layer after forming a resist pattern one time, without a resist pattern directly formed on the first metal layer.
申请公布号 US2002006700(A1) 申请公布日期 2002.01.17
申请号 US20010848235 申请日期 2001.05.04
申请人 KANAMORI JUN;KATAKURA YOSHIAKI 发明人 KANAMORI JUN;KATAKURA YOSHIAKI
分类号 H01L21/3213;H01L21/02;H01L21/768;H01L21/822;H01L27/04;(IPC1-7):H01L47/00 主分类号 H01L21/3213
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