| 摘要 |
<p>An apparatus and method for testing a socket (16) on a burn-in board (18) using a flex strip probe (12). The flex strip probe (12) is a flex strip having wires (24) with leads (22) on one and connected to a tester (14) at the other end. The leads (22) are inserted into a socket (16) and the tester (14) provides signals to and from the socket (16) through the flex strip probe (12). The signal simulates the signals to a semiconductor package which will be inserted into the socket (16) and tested. If necessary, a second flex strip probe (12) can be used in conjunction wiht a first flex strip.</p> |
