发明名称 SYSTEMS AND METHODS FOR VARIABLE MODE PLASMA ENHANCED PROCESSING OF SEMICONDUCTOR WAFERS
摘要 Variable mode plasma system and method for processing a semiconductor wafer. The modulation of the plasma potential relative to the semiconductor wafer is varied for different process steps. A capacitive shield may be selectively grounded to vary the level of capacitive coupling and modulation of the plasma. Process pressures, gases and power level may also be modified for different process steps. Plasma properties may easily be tailored to specific layers and materials being processed on the surface of the wafer. Variable mode processes may be adapted for (i) removal of photoresist after high-dose ion implant, (ii) post metal etch polymer removal, (iii) via clean, and (iv) other plasma enhanced processes.
申请公布号 US2002005392(A1) 申请公布日期 2002.01.17
申请号 US19980192810 申请日期 1998.11.16
申请人 LUO LEROY;GEORGE RENE;SAVAS STEPHEN E.;RANFT CRAIG;HELLE WOLFGANG;GUERRA ROBERT 发明人 LUO LEROY;GEORGE RENE;SAVAS STEPHEN E.;RANFT CRAIG;HELLE WOLFGANG;GUERRA ROBERT
分类号 G03F7/42;H01J37/32;H01L21/02;H01L21/306;H01L21/311;H01L21/3213;(IPC1-7):B44C1/22 主分类号 G03F7/42
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