发明名称 METHOD FOR DEPOSITING COPPER ONTO BARRIER LAYER
摘要 PURPOSE: A copper depositing method is provided to absolutely capsulate a copper film on a barrier layer by using an electroless copper plating. CONSTITUTION: An electroless plating bath having a pH of at least 12.89 is used for allowing a copper(5) to adhere onto a barrier layer(3) such as tungsten at an adhesion speed of 50 nm/minute or less. By using the method, a trench(4) or via having an aspect ratio larger than 3 to 1 can become copper wiring with improved coherency.
申请公布号 KR20020004826(A) 申请公布日期 2002.01.16
申请号 KR20010031320 申请日期 2001.06.05
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ANDRICACOS PANAYOTIS;BOETTCHER STEVEN H.;MCFEELY FENTON READ;PAUNOVIC MILAN
分类号 H01L21/205;C23C18/40;H01L21/288;H01L21/3205;H01L21/768;H01L23/52;(IPC1-7):H01L21/205 主分类号 H01L21/205
代理机构 代理人
主权项
地址