发明名称 |
METHOD FOR DEPOSITING COPPER ONTO BARRIER LAYER |
摘要 |
PURPOSE: A copper depositing method is provided to absolutely capsulate a copper film on a barrier layer by using an electroless copper plating. CONSTITUTION: An electroless plating bath having a pH of at least 12.89 is used for allowing a copper(5) to adhere onto a barrier layer(3) such as tungsten at an adhesion speed of 50 nm/minute or less. By using the method, a trench(4) or via having an aspect ratio larger than 3 to 1 can become copper wiring with improved coherency.
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申请公布号 |
KR20020004826(A) |
申请公布日期 |
2002.01.16 |
申请号 |
KR20010031320 |
申请日期 |
2001.06.05 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
ANDRICACOS PANAYOTIS;BOETTCHER STEVEN H.;MCFEELY FENTON READ;PAUNOVIC MILAN |
分类号 |
H01L21/205;C23C18/40;H01L21/288;H01L21/3205;H01L21/768;H01L23/52;(IPC1-7):H01L21/205 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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