发明名称 SEMICONDUCTOR PLASMA ETCH EQUIPMENT
摘要 PURPOSE: A semiconductor plasma etch equipment is provided to improve etch uniformity by controlling convection within a chamber. CONSTITUTION: A gas is transmitted from an external gas tank to a gas injection hole formed on an upper portion of a chamber(100). The gas is transmitted to a wafer(106) through a multitude of hole formed on an upper electrode(103). The gas is changed to a plasma state if an RF power is applied between the upper electrode(103) and a lower electrode(104). The wafer(106) is etched by using plasma. The wafer(106) is located on a center portion of the lower electrode(104). The wafer(106) is fixed by a guide ring(107) formed on an edge of the lower electrode(104). A pump(114) is installed at a lower portion of one side of the chamber(100) in order to discharge the etch gas. A convection controller is installed around the lower electrode(104) in order to etch uniformly the wafer(106) by controlling convection within the chamber(100).
申请公布号 KR20020004623(A) 申请公布日期 2002.01.16
申请号 KR20000038687 申请日期 2000.07.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JONG CHEOL
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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