发明名称 |
SEMICONDUCTOR PLASMA ETCH EQUIPMENT |
摘要 |
PURPOSE: A semiconductor plasma etch equipment is provided to improve etch uniformity by controlling convection within a chamber. CONSTITUTION: A gas is transmitted from an external gas tank to a gas injection hole formed on an upper portion of a chamber(100). The gas is transmitted to a wafer(106) through a multitude of hole formed on an upper electrode(103). The gas is changed to a plasma state if an RF power is applied between the upper electrode(103) and a lower electrode(104). The wafer(106) is etched by using plasma. The wafer(106) is located on a center portion of the lower electrode(104). The wafer(106) is fixed by a guide ring(107) formed on an edge of the lower electrode(104). A pump(114) is installed at a lower portion of one side of the chamber(100) in order to discharge the etch gas. A convection controller is installed around the lower electrode(104) in order to etch uniformly the wafer(106) by controlling convection within the chamber(100).
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申请公布号 |
KR20020004623(A) |
申请公布日期 |
2002.01.16 |
申请号 |
KR20000038687 |
申请日期 |
2000.07.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, JONG CHEOL |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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