发明名称 |
METHOD FOR FORMING CONTACT PAD OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a contact pad of a semiconductor device is provided to prevent generation of a bridge formed between contact pads by forming an insulating layer having a contact hole. CONSTITUTION: A gate(251) protected by a shield layer(255) is formed on a side and an upper face of a semiconductor substrate(100). A dummy insulating layer is formed to cover a gap between the gates(251). A dummy contact hole is formed by patterning the dummy insulating layer. An interlayer dielectric(500) is formed on the dummy insulating layer in order to fill the dummy contact hole. A planarization process for the interlayer dielectric(500) is performed. A wet etch process for the planarized interlayer dielectric(500) is performed. The dummy insulating layer is removed selectively according to an etch selection ratio. A contact hole(550) is formed on a position of the removed dummy insulating layer. A conductive pad is formed to fill the contact hole(550).
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申请公布号 |
KR20020004171(A) |
申请公布日期 |
2002.01.16 |
申请号 |
KR20000037768 |
申请日期 |
2000.07.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KOO, JU SEON;SHIN, HONG JAE |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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主权项 |
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地址 |
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