发明名称 METHOD FOR INSULATING FINE STRUCTURE OF SINGLE CRYSTALLINE SILICON USING TRIPLE LAYER
摘要 PURPOSE: A method for insulating a fine structure of a single crystalline silicon using a triple layer is provided to insulate a fine structure of a single crystalline silicon without an additional photo/etch process. CONSTITUTION: A thermal oxide layer is formed on a fine structure of single crystalline silicon by performing a thermal oxidation process. A conductive layer is insulated electrically with a single crystalline silicon substrate by the thermal oxide layer. A doped polysilicon layer is deposited on a surface of the thermal oxide layer by using an LPCVD(Low Pressure Chemical Vapor Deposition) method. An aluminium layer is deposited on an upper portion of a trench and a part of a sidewall of the trench by using a sputtering method or a deposition method. Each electrode is insulated by etching the deposited polysilicon layer and removing a part of the deposited polysilicon.
申请公布号 KR20020004135(A) 申请公布日期 2002.01.16
申请号 KR20000037659 申请日期 2000.07.03
申请人 CHO, DONG IL 发明人 CHO, DONG IL;LEE, SANG U;PARK, SANG JUN
分类号 B81B3/00;B81C1/00;H01L21/764;(IPC1-7):H01L21/31 主分类号 B81B3/00
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