发明名称 AREA ARRAY AIR GAP STRUCTURE FOR INTERMETAL DIELECTRIC APPLICATION
摘要 <p>A new method of forming air gaps between adjacent conducting lines of a semiconductor circuit by using a "holes everywhere" or a "reverse metal holes" mask that can be used to create holes in a dielectric layer. The dielectric that is being etched has been deposited across conducting lines, the holes that are being formed in this manner are closed by depositing a dielectric across the top of the holes. The holes can be etched across the entire layer of the deposited dielectric or can be etched in between the conducting lines. <IMAGE></p>
申请公布号 SG85632(A1) 申请公布日期 2002.01.15
申请号 SG19990001581 申请日期 1999.03.31
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD 发明人 LAP CHAN;KHENG CHOK TEE;ONG KOK KENG;SEAH CHIN HWEE
分类号 H01L21/768;(IPC1-7):H01L21/476;C01L21/76 主分类号 H01L21/768
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