发明名称 METHOD AND APPARATUS FOR MEASURING PARAMETER OF ELECTRONIC SYSTEM
摘要 <p>PROBLEM TO BE SOLVED: To measure the timing error in a digital transmission system such as the MITE (340) in a synchronous digital hierarchy system by generating a first series of temporally changing measured values (300) as to a given parameter in real time over an observation period of a first length (each observation period is longer than a sample period by many times) through the use of a sample (225) in a first stage (260). SOLUTION: Succeeding stages (280, 280') introduce a series of additional measured values corresponding to observation periods that the derived by handling a preceding observation period as a sub period and gradually becoming longer. In the first stage (206), an intermediate result is derived for a prescribed interval, it is repeated for consecutive subs periods, an FIFO data set (300) stores the intermediate result and the result is updated once as to at least one sub period to device a required parameter (335). In the second and succeeding stages, the required parameter corresponding to the length of the observation periods gradually becoming longer is similarly derived and the measured value is updated as the updated data set.</p>
申请公布号 JP2002009723(A) 申请公布日期 2002.01.11
申请号 JP20010128955 申请日期 2001.04.26
申请人 AGILENT TECHNOL INC 发明人 BALLANTYNE ALEX;TAYLOR DAVID FINLAY
分类号 G01R29/02;H04J3/00;H04J3/06;H04J3/14;H04L1/20;H04L1/24;H04L7/00;(IPC1-7):H04J3/14 主分类号 G01R29/02
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