发明名称 Configuration of deep and less deep insulating regions within the substrate of an integrated circuit prior to the configuration of the transistors
摘要 Prior to the implementation of transistors, one configures within the substrate a deep insulated drain following the configuration within the substrate of a less deep insulated drain lengthening the deep drain. The configuration of the deep drain includes a coating of the internal walls of the drain by an initial layer of oxide (100) obtained by a rapid thermal oxidation and a filling of the drain with polysilicon (120) inside an envelope formed with an insulating material (101). The configuration of the less deep drain also includes a coating of the internal walls with an initial oxide layer (15) obtained by rapid thermal oxidation and a filling with an insulating material (16, 17). An Independent claim is also included for an integrated circuit incorporating within a substrate some insulating deep drain and less deep drain regions separating the transistors.
申请公布号 FR2811473(A1) 申请公布日期 2002.01.11
申请号 FR20000008686 申请日期 2000.07.04
申请人 STMICROELECTRONICS SA 发明人 MARTY MICHEL;BAUDRY HELENE;LEVERD FRANCOIS
分类号 H01L21/316;H01L21/762;H01L21/763 主分类号 H01L21/316
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