发明名称 TRENCH CAPACITOR IN SOI BOARD AND ITS FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To solve the problem that the trench capacitor of an SOI board must conventionally extend a trench opening through the insulation body layer of the SOI board and is isolated from a board surface by the isolation body film of a board structure not to be easily contacted. SOLUTION: The trench capacitor 47 formed on the SOI board extends into a semiconductor base board 1 through an upward silicon layer 5 and the isolation layer. The outside electrode of the trench capacitor includes the part of the semiconductor base board 1 making the boundary of a trench forming the trench capacitor. The outside electrode is formed immediately near to the trench capacitor, and connected to a contact structure 45 extending through the isolation layer. The method for simultaneously preparing the trench capacitor 47 and the contact structure 45 includes a step for forming two trench openings 51, 53, a step for forming a dielectric liner on one of the trench openings 51, 53, and a step for filling the trench openings respectively with a semiconductor substance.
申请公布号 JP2002009164(A) 申请公布日期 2002.01.11
申请号 JP20010116899 申请日期 2001.04.16
申请人 AGERE SYSTEMS INC 发明人 SAILESH CHITEIPEDEI;PEARCE CHARLES WALTER;ROY PRADIP KUMAR
分类号 H01L27/04;H01L21/334;H01L21/76;H01L21/822;H01L21/8242;H01L27/108;H01L27/12;H01L29/94 主分类号 H01L27/04
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