发明名称 POLISHING PAD AND POLISHING DEVICE AND METHOD USING IT
摘要 PROBLEM TO BE SOLVED: To reduce dust adhered to the surface of an object to be polished, to reduce scratches while ensuring a high flattening property and further to eliminate microscopic irregularity of a semiconductor wafer itself before finishing, that is, to correct defects expressed as waviness, nanotopology or the like by a simple polishing method. SOLUTION: The polishing pad consists of an organic polymeric matrix which is formed by laminating materials in sheet form which are hydrophilic and are substantially insoluble in water.
申请公布号 JP2002009026(A) 申请公布日期 2002.01.11
申请号 JP20000185766 申请日期 2000.06.21
申请人 TORAY IND INC 发明人 SHIMAGAKI MASAAKI;MINAMIGUCHI NAOSHI
分类号 B24B37/20;B24B37/22;B24B37/24;C08J5/14;C08K3/00;C08L101/00;C09K3/14;H01L21/304 主分类号 B24B37/20
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