发明名称 ETCHING METHOD AND ETCHING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method and a device for stably etching noble metal and a substance including noble metal. SOLUTION: Gas is evacuated by a pump 3 as an evacuation device while prescribed gas is introduced into a vacuum container 1 from a gas supply device 2. The high frequency power of 100 MHz is supplied to an antenna 5 which is protrusively installed in the vacuum container 1 by an antenna high frequency power source 4 while the vacuum container 1 is kept to prescribed pressure. Thus, plasma is generated in the vacuum container 1 and a substrate 7 placed on a substrate electrode 6 is etched. When self-bias voltage is set to -310 V, a substrate temperature to 10 deg.C and the substrate with iridium whose film thickness is 200 nm is etched in the device, a deposit film formed on an etching sidewall can easily be removed in a subsequent washing process.
申请公布号 JP2002009055(A) 申请公布日期 2002.01.11
申请号 JP20000187254 申请日期 2000.06.22
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OKUMURA TOMOHIRO;KAI TAKAYUKI;YASHIRO YOICHIRO
分类号 H05H1/46;B81C1/00;C23F4/00;H01L21/302;H01L21/3065 主分类号 H05H1/46
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