发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT, MEMORY REPAIR METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT AND COMPUTER READABLE RECORDING MEDIUM STORED WITH PROGRAM FOR ALLOWING COMPUTER TO EXECUTE THE METHOD |
摘要 |
PURPOSE: To provide a semiconductor integrated circuit for improving yield. CONSTITUTION: This semiconductor integrated circuit is provided with plural RAM 10-12, a supplementary RAM 13, test/repair control logics 2 and 3 for testing the failure detection of the plural RAM 10-12, and selectors 20-23 and 30-32 for supplying the supplementary RAM 13 corresponding to the RAM whose failure is detected among the plural RAM 10-12 based on a repair control signal corresponding to the test results obtained by the test/repair control logics 2 and 3.
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申请公布号 |
KR20020003076(A) |
申请公布日期 |
2002.01.10 |
申请号 |
KR20010011345 |
申请日期 |
2001.03.06 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
GOTO KOJI;OKAMOTO YASUSHI;YAMAMOTO SEIJI |
分类号 |
G01R31/28;G06F12/16;G11C29/00;G11C29/04;G11C29/12;G11C29/14;G11C29/44;G11C29/50;(IPC1-7):G11C29/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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