Trimming circuit of semiconductor apparatus

摘要

A relatively compact trimming circuit for hypothetically breaking a fuse includes a resistance bypass circuit connected to a node between a resistor and a fuse. The bypass circuit selectively performs ordinary breakage and hypothetical breakage of the fuse in accordance with a control signal and a data signal. An output changeover circuit connected to the node generates a first output signal in accordance with a state of the fuse during the ordinary breakage. The output changeover circuit generates a second output signal in accordance with the data signal during the hypothetical breakage.