发明名称 |
Semiconductor memory device and production method of the same |
摘要 |
A semiconductor memory device includes: a capacitor formed on a substrate and including a lower electrode, a dielectric film and an upper electrode; a selection transistor formed at the substrate; an electrically conductive plug for providing electrical connection between the selection transistor and the capacitor; and a diffusion barrier film provided between the electrically conductive plug and the lower electrode of the capacitor. The diffusion barrier film is a TaxSi1-xNy film or a HfxSi1-xNy film (where 0.2<x<1 and 0<y<1). The lower electrode includes an Ir film and an IrO2 film which are sequentially formed.
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申请公布号 |
US2002003247(A1) |
申请公布日期 |
2002.01.10 |
申请号 |
US20010950804 |
申请日期 |
2001.09.13 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
YOKOYAMA SEIICHI;MITARAI SHUN;NAGATA MASAYA;KUDO JUN;OGATA NOBUHITO;ITOH YASUYUKI |
分类号 |
H01L21/02;H01L21/316;H01L21/768;H01L21/8246;H01L27/115;(IPC1-7):H01L27/108 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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