发明名称 Memory testing method
摘要 In the case where the internal configuration is different in each memory (in the case where the correspondence information between the program address designated by the testing program and the physical address in the memory is different), the correspondence information of each memory is input from externally to the memory testing program, so that it becomes possible to use versatilely the memory testing program. Furthermore, even in the case where the internal configuration is unclear, it becomes possible to presume the internal configuration, so that it becomes possible to use versatilely the memory testing program for various memories.
申请公布号 US2002003731(A1) 申请公布日期 2002.01.10
申请号 US20000750098 申请日期 2000.12.29
申请人 FUJITSU LIMITED 发明人 SATO SATOSHI;FURUKAWA TAKESHI;MATSUMOTO AKIKO
分类号 G01R31/28;G01R31/3183;G06F12/16;G11C29/10;G11C29/56;(IPC1-7):G11C29/00 主分类号 G01R31/28
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