发明名称 |
Verfahren zur Herstellung einer piezoelektrischen Dünnschicht |
摘要 |
<p>A piezoelectric thin film having good properties, for example, a high dielectric constant and a high piezoelectric strain constant is disclosed. Further, a method for producing the same which does not suffer from cracks at the time of annealing is also disclosed. The piezoelectric thin film according to the present invention comprises a thin film with the average grain area of crystal grains observed on the surface of the thin film being not less than 0.1 mu m<2>, the thin film having no multilayer structure in its cross section. The method for producing the piezoelectric thin film is based on a sol-gel process and comprises the steps of: coating a substrate with a sol composition comprising a sol, of a metal component for constituting a piezoelectric film, and a polymer compound and then drying the coating to form a film; pre-sintering the film to form a porous thin film of gel comprising an amorphous metal oxide; pre-annealing the porous thin film of gel to convert the film to a film of a crystalline metal oxide; repeating the steps at least once to form laminated films of a crystalline metal oxide; and annealing the films thus prepared to grow crystal grains of perovskite type in the film into a larger size. <IMAGE></p> |
申请公布号 |
DE69617288(D1) |
申请公布日期 |
2002.01.10 |
申请号 |
DE1996617288 |
申请日期 |
1996.02.20 |
申请人 |
SEIKO EPSON CORP., TOKIO/TOKYO |
发明人 |
MIYASHITA, SATORU;SHINOZUKA, MASAKAZU;TAKAHASHI, TETSUSHI |
分类号 |
B41J2/045;B41J2/055;B41J2/135;B41J2/14;B41J2/16;H01L21/324;H01L41/09;H01L41/187;H01L41/39;(IPC1-7):H01L41/24 |
主分类号 |
B41J2/045 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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