发明名称 METHOD FOR FORMING INTERLAYER DIELECTRIC OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming interlayer dielectric of a semiconductor device is provided to increase an operating speed of a device, reduce of a sensing voltage of a sensing amplifier and secure a margin by reducing a capacitance of a word line and a bit line. CONSTITUTION: A low dielectric porous layer is formed on a semiconductor substrate having a device structure by a spin coating method. A silica reticular structure is formed into the porous layer. After performing hydrogen evaporation process to evaporating hydrogen at the porous layer, a bake process and a curing process is performed. The silica reticular structure is formed by means of a supercritical drying method or by curing at room pressure.
申请公布号 KR20020002731(A) 申请公布日期 2002.01.10
申请号 KR20000037017 申请日期 2000.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 AHN, SANG TAE;SONG, JEONG GYU
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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