发明名称 INTEGRATED ELECTRONIC HARDWARE FOR WAFER PROCESSING CONTROL AND DIAGNOSTIC
摘要 A central controller for use in a semiconductor manufacturing equipment integrates a plurality of controllers with an open architecture allowing real-time communication between the various control loops. The central controller includes at least one central processing unit (cpu) executing high level input output (i/o) and control algorithms and at least one integrated i/o controller providing integrated interface to sensors and control hardware. The integrated i/o controllet performs basic i/o and low level control functions and communicates with the CPU through a bus to perform or enable controls of various subsystems of the semiconductor manufacturing equipment. A method for controlling a plurality of sensors and a plurality of control hardware for use in a semidonductor manufacturing equipment loads an application software onto a cpu board that is plugged in a bus. Sensors and control hardware are linked to electrical controllers that are mounted onto a single circuit board which occupies an address block in a memory space of the bus. The single circuit board is then plugged in the bus and the sensors and control hardware are controlled via the application software.
申请公布号 WO0203416(A2) 申请公布日期 2002.01.10
申请号 WO2001US20830 申请日期 2001.06.28
申请人 LAM RESEARCH CORPORATION 发明人 NGO, TUAN;KAVEH, FARRO;LAM, CONNIE;HUANG, CHUNG-HO;NI, TUQIANG;LE, ANTHONY, T.;SALKOW, STEVEN
分类号 H01L21/3065;G05B19/042;H01J37/32;H01L21/02;(IPC1-7):H01J37/00 主分类号 H01L21/3065
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