发明名称 |
A CONDITIONING MECHANISM IN A CHEMICAL MECHANICAL POLISHING APPARATUS FOR SEMICONDUCTOR WAFERS |
摘要 |
A method and apparatus for conditioning a polishing pad (12) are described. The method includes steps of providing a chemical mechanical polishing apparatus having a polishing region and a conditioning region; cycling a polishing member (12) through the apparatus; contacting the polishing member (12) in the conditioning region with a conditioning member (50); and conditioning the polishing member (12). The apparatus includes an end effector (70) adapted to receive a conditioning member, the end effector (70) being attached to an arm (65) that can be moved horizontally and vertically, and a strain gauge that monitors the force applied to a polishing member (12). |
申请公布号 |
WO0202277(A2) |
申请公布日期 |
2002.01.10 |
申请号 |
WO2001US20594 |
申请日期 |
2001.06.28 |
申请人 |
LAM RESEARCH CORPORATION |
发明人 |
VOGTMANN, MICHAEL;FREDERICKSON, CHRIS;GASPARITSCH, JEFF;HEMPLE, GENE;ENGDAHL, ERIK |
分类号 |
B24B21/04;B24B49/16;B24B53/017;B24B53/12 |
主分类号 |
B24B21/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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