发明名称 A CONDITIONING MECHANISM IN A CHEMICAL MECHANICAL POLISHING APPARATUS FOR SEMICONDUCTOR WAFERS
摘要 A method and apparatus for conditioning a polishing pad (12) are described. The method includes steps of providing a chemical mechanical polishing apparatus having a polishing region and a conditioning region; cycling a polishing member (12) through the apparatus; contacting the polishing member (12) in the conditioning region with a conditioning member (50); and conditioning the polishing member (12). The apparatus includes an end effector (70) adapted to receive a conditioning member, the end effector (70) being attached to an arm (65) that can be moved horizontally and vertically, and a strain gauge that monitors the force applied to a polishing member (12).
申请公布号 WO0202277(A2) 申请公布日期 2002.01.10
申请号 WO2001US20594 申请日期 2001.06.28
申请人 LAM RESEARCH CORPORATION 发明人 VOGTMANN, MICHAEL;FREDERICKSON, CHRIS;GASPARITSCH, JEFF;HEMPLE, GENE;ENGDAHL, ERIK
分类号 B24B21/04;B24B49/16;B24B53/017;B24B53/12 主分类号 B24B21/04
代理机构 代理人
主权项
地址
您可能感兴趣的专利