发明名称 METHOD AND APPARATUS FOR RAPID THERMAL PROCESSING (RTP) OF SEMICONDUCTOR WAFERS
摘要 A system, method, and apparatus is presented for processing a semiconductor substrate in an RTP system, where the surface of the substrate is contacted with an organic halogen containing gas. The substrate temperature is greater than the temperature at which the organic halogen gas dissociates to give free halogen. In the most preferred embodiment, oxygen is also present and a film of chlorinated silicon dioxide is grown on a silicon substrate.
申请公布号 WO0203438(A1) 申请公布日期 2002.01.10
申请号 WO2001IB01229 申请日期 2001.07.06
申请人 MATTSON THERMAL PRODUCTS INC. 发明人 SHARANGPANI, RAHUL;TAY, SING-PIN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址