Ruhestromprüfbarer RAM

摘要

An electronic circuit includes an array of a number of memory cells that are functionally organized in rows and columns. The circuit includes test circuitry that is selectively operative to access all cells of the array in parallel. An IDDQ-test then discovers whether or not there is a defect in any of the cells. This results in a test circuit which is faster, more efficient and more economical than previously-available circuits.