| 摘要 |
PROBLEM TO BE SOLVED: To provide a probe card reducing a slide amount while securing an even needle pressure and having probes capable of complying with a fine pitch. SOLUTION: The extension bases of the respective probes 10 are arranged regularly in four layers (Lay-1-Lay-4). This is a generally known technique used when a contact area pitch is smaller than a probe wire material diameter (base material diameter). Each probe 10 is provided with a bend part 11 matching the extension from each layer, and a probe tip 12 is brought into contact with each contact area (a pad, a bump, or the like) of an object. An extension part ranging to the bend part 11 of each probe 10 is covered with an insulative coating resin member 13 so as to be fixed.
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