发明名称 OBSERVATION METHOD FOR FINE THREE-DIMENSIONAL SHAPE ON SURFACE OF SAMPLE USING SCANNING ELECTRON MICROSCOPE
摘要 <p>PROBLEM TO BE SOLVED: To provide an observation method for the fine three-dimensional shape on the surface of a sample using a scanning electron microscope, where the three-dimensional shape on the flat surface of the sample can be observed three-dimensionally and precisely, by using the electron microscope so that the observation is useful for the process control and the quality control of a production process for a product which is manufactured via a rolling process, an extrusion process or the like and which is composed of various plastic materials, especially for a product such as a foil material, a sheet material or the like which is composed of metallic materials. SOLUTION: In the observation method for the fine three-dimensional shape on the surface of the sample using the scanning electron microscope, when the three-dimensional shape on the flat surface of the sample is observed by using the electron microscope, an observation face which is curved at a fine curvature is formed on a place to be observed, the observation face is irradiated with a primary electron beam, and the three-dimensional shape on the surface of the sample is observed.</p>
申请公布号 JP2002005642(A) 申请公布日期 2002.01.09
申请号 JP20000183489 申请日期 2000.06.19
申请人 NIPPON LIGHT METAL CO LTD 发明人 KOBAYASHI YASUO;WATAI TAKAHIKO
分类号 G01B15/00;G01B15/04;G01B15/08;G01N1/28;G01N23/225;(IPC1-7):G01B15/00 主分类号 G01B15/00
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