发明名称 MEASURING METHOD FOR IMAGE FORMING CHARACTERISTIC, MEASURING DEVICE FOR IMAGE FORMING CHARACTERISTIC, EXPOSURE METHOD, EXPOSURE DEVICE, AND MANUFACTURING METHOD FOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a measuring method for an image forming characteristic, a measuring device for an image forming characteristic, an exposure method, an exposure device, and a manufacturing method for a device, capable of accurately measuring the image forming characteristic of an optical system in a simple constitution. SOLUTION: The measuring device S for the image characteristic for measuring a numerical aperture of a projecting optical system PL has a mask M for generating diffraction light DL having different incident anglesθon the projecting optical system PL by the illumination of exposure light EL; a detector A capable of detecting the amount of light of the diffraction light DL passed through the projecting optical system PL; and an arithmetic unit CONT for calculating the numerical aperture NA of the projecting optical system PL based on the variation of the amount of light of the diffraction light DL having different incident anglesθdetected with the detector A.
申请公布号 JP2002005787(A) 申请公布日期 2002.01.09
申请号 JP20000183797 申请日期 2000.06.19
申请人 NIKON CORP 发明人 TAKEUCHI YUICHIRO
分类号 G01M11/02;G03F7/20;H01L21/027;(IPC1-7):G01M11/02 主分类号 G01M11/02
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