发明名称 METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to guarantee sufficient capacitance and to improve an electrical characteristic, by using metal as upper and lower electrodes and by using a double structure of a titanium-added tantalum oxide layer and an amorphous tantalum oxide layer as a dielectric layer. CONSTITUTION: A plug(13) and a diffusion barrier layer(14) are formed on a semiconductor substrate(11) in which a predetermined structure is formed. A Ru layer(16) is evaporated on the resultant structure, and is patterned to form a lower electrode. After a titanium-added tantalum oxide layer(17) is formed on the resultant structure, a heat treatment process is performed. An amorphous tantalum oxide layer(18) is formed on the titanium-added tantalum oxide layer. A metal layer is evaporated on the resultant structure to form an upper electrode(19).
申请公布号 KR20020001378(A) 申请公布日期 2002.01.09
申请号 KR20000036053 申请日期 2000.06.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, DONG JUN;KIM, GYEONG MIN;SONG, HAN SANG
分类号 H01L21/8242;H01L21/02;H01L21/316;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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