发明名称 |
METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to guarantee sufficient capacitance and to improve an electrical characteristic, by using metal as upper and lower electrodes and by using a double structure of a titanium-added tantalum oxide layer and an amorphous tantalum oxide layer as a dielectric layer. CONSTITUTION: A plug(13) and a diffusion barrier layer(14) are formed on a semiconductor substrate(11) in which a predetermined structure is formed. A Ru layer(16) is evaporated on the resultant structure, and is patterned to form a lower electrode. After a titanium-added tantalum oxide layer(17) is formed on the resultant structure, a heat treatment process is performed. An amorphous tantalum oxide layer(18) is formed on the titanium-added tantalum oxide layer. A metal layer is evaporated on the resultant structure to form an upper electrode(19).
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申请公布号 |
KR20020001378(A) |
申请公布日期 |
2002.01.09 |
申请号 |
KR20000036053 |
申请日期 |
2000.06.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, DONG JUN;KIM, GYEONG MIN;SONG, HAN SANG |
分类号 |
H01L21/8242;H01L21/02;H01L21/316;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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