发明名称 |
METHOD FOR MANUFACTURING PASSIVATION LAYER |
摘要 |
PURPOSE: A method for manufacturing a passivation layer is provided to reduce manufacturing cost and a thickness of positive resist, by using new positive resist capable of functioning as negative resist. CONSTITUTION: A surface treatment process using a hexamethyl disilazane(HMDS) solution is performed regarding a finished semiconductor device to improve adhesion of resist. Positive resist is applied on the surface-treated semiconductor device. A soft bake process is performed regarding the applied positive resist. An exposure process is performed regarding the soft-baked positive resist. A surface treatment process using an HMDS solution is repeated regarding the surface of the exposed positive resist. A heat treatment process is performed regarding the twice surface-treated positive resist for a predetermined interval of time. The positive resist is a compound of polyamic acid and diazo-naphtoquinone(DNQ).
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申请公布号 |
KR20020001430(A) |
申请公布日期 |
2002.01.09 |
申请号 |
KR20000036145 |
申请日期 |
2000.06.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHOI, CHANG IL;NOH, CHI HYEONG |
分类号 |
H01L23/556;(IPC1-7):H01L23/556 |
主分类号 |
H01L23/556 |
代理机构 |
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地址 |
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