发明名称 ULTRASONIC PROBE AND DEFECT EVALUATION METHOD USING IT
摘要 PROBLEM TO BE SOLVED: To provide an ultrasonic probe capable of detecting even an inclined defect and having high evaluation precision of the defect, and a defect evaluation method using the probe. SOLUTION: This ultrasonic probe is formed by providing a pair of probes 12, 13 disposed so that an ultrasonic wave entering a test object (canopy seal part) from one probe 12 is reflected by the bottom surface of the test object to generate a bottom surface echo and that the bottom surface echo is returned to the other probe 13. The ultrasonic probe is formed so that the pair of the probes are pressed on the surface of the test object by respective elastic bodies and that the pair of the probes trace the surface of the test object respectively. A first direct projection method measurement, a second direct projection method measurement and a transmission method measurement are executed by using the ultrasonic probe, and evaluation of the defect is executed based on the results. Measurement by an end part echo method or a TOFD method is also executed by raising measurement sensitivity, and the defect is also evaluated from the result.
申请公布号 JP2002005904(A) 申请公布日期 2002.01.09
申请号 JP20000189201 申请日期 2000.06.23
申请人 MITSUBISHI HEAVY IND LTD 发明人 AZUMA MASATAKE;KIRITO AKIHIRO
分类号 G01N29/04;G01N29/22;G01N29/44;G21C17/003;(IPC1-7):G01N29/10;G01N29/08 主分类号 G01N29/04
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