发明名称 POSITION MEASURING METHOD AND APPARATUS FOR OBJECT
摘要 <p>PROBLEM TO BE SOLVED: To detect an object with high accuracy, even if a fine radiation point moves in the image pickup of the object through transmission using an X-ray source which has minute radiation point. SOLUTION: In the position measuring method of an object 13, where X rays 12 radiated from an X-ray source 11 having a radiation point are transmitted through the object 13 for imaging with an X-ray image pickup tube 14, relationship is obtained beforehand between the X-ray radiation time and the movement value of the position of a reference object within the X-ray image pickup tube. The movement value of the position of the reference object within the X-ray image pickup tube is found from the actual radiation time, to correct the position of the object to be measured.</p>
申请公布号 JP2002005854(A) 申请公布日期 2002.01.09
申请号 JP20000188897 申请日期 2000.06.23
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KUBO HIROYASU;KOBAYASHI AKIRA
分类号 G01B15/00;G01N23/04;(IPC1-7):G01N23/04 主分类号 G01B15/00
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