发明名称 |
POSITION MEASURING METHOD AND APPARATUS FOR OBJECT |
摘要 |
<p>PROBLEM TO BE SOLVED: To detect an object with high accuracy, even if a fine radiation point moves in the image pickup of the object through transmission using an X-ray source which has minute radiation point. SOLUTION: In the position measuring method of an object 13, where X rays 12 radiated from an X-ray source 11 having a radiation point are transmitted through the object 13 for imaging with an X-ray image pickup tube 14, relationship is obtained beforehand between the X-ray radiation time and the movement value of the position of a reference object within the X-ray image pickup tube. The movement value of the position of the reference object within the X-ray image pickup tube is found from the actual radiation time, to correct the position of the object to be measured.</p> |
申请公布号 |
JP2002005854(A) |
申请公布日期 |
2002.01.09 |
申请号 |
JP20000188897 |
申请日期 |
2000.06.23 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KUBO HIROYASU;KOBAYASHI AKIRA |
分类号 |
G01B15/00;G01N23/04;(IPC1-7):G01N23/04 |
主分类号 |
G01B15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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