发明名称 COLUMN REPAIR CIRCUIT
摘要 PURPOSE: A column repair circuit is provided, which can reduce current consumption by using a latch type X-fuse block and a dynamic type Y-fuse block without a transfer control circuit to transfer information of an X-fuse set to a Y-fuse set. CONSTITUTION: A latch type X-fuse block(500) includes a latch type fuse set(501) determining a signal of a fuse(FUSE) according to the state of the fuse by receiving a signal(init) initializing each part of a semiconductor memory device, and a switching device(502) receiving each output signal of the latch type fuse set and a row address signal(gax) indicating a specific X-block and switching a path corresponding to their signals. A latch circuit part(503) latches an output signal of the switching device a signal(rad) activating a corresponding bank and a corresponding bank precharge signal(pcg).
申请公布号 KR20020001996(A) 申请公布日期 2002.01.09
申请号 KR20000036388 申请日期 2000.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, SAENG HWAN
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
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