发明名称 METHOD FOR MANUFACTURING CONTACT PLUG USING SELECTIVE EPITAXIAL GROWTH
摘要 PURPOSE: A method for manufacturing a contact plug using a selective epitaxial growth is provided to increase a doping density of phosphorous in the contact plug, by using a boron phosphorous silicate glass(BPSG) layer as an interlayer dielectric wherein a relative quantity of tetra methyl phosphorous(TMB) in the BPSG layer is increased. CONSTITUTION: An interlayer dielectric is formed on a silicon substrate having several wordlines. The interlayer dielectric is made of a boron phosphorous silicate glass(BPSG) layer, and is etched to form a contact hole simultaneously exposing the predetermined number of wordlines and a silicon substrate region among the wordlines. The contact hole is filled with a conductive layer for a contact plug which is made of a single crystal silicon layer using a selective epitaxial growth. The conductive layer is polished.
申请公布号 KR20020001417(A) 申请公布日期 2002.01.09
申请号 KR20000036130 申请日期 2000.06.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, U SEOK;KIM, BONG SU;SHIN, DONG SEOK
分类号 H01L21/20;(IPC1-7):H01L21/20 主分类号 H01L21/20
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