发明名称 |
METHOD FOR MANUFACTURING CONTACT PLUG USING SELECTIVE EPITAXIAL GROWTH |
摘要 |
PURPOSE: A method for manufacturing a contact plug using a selective epitaxial growth is provided to increase a doping density of phosphorous in the contact plug, by using a boron phosphorous silicate glass(BPSG) layer as an interlayer dielectric wherein a relative quantity of tetra methyl phosphorous(TMB) in the BPSG layer is increased. CONSTITUTION: An interlayer dielectric is formed on a silicon substrate having several wordlines. The interlayer dielectric is made of a boron phosphorous silicate glass(BPSG) layer, and is etched to form a contact hole simultaneously exposing the predetermined number of wordlines and a silicon substrate region among the wordlines. The contact hole is filled with a conductive layer for a contact plug which is made of a single crystal silicon layer using a selective epitaxial growth. The conductive layer is polished.
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申请公布号 |
KR20020001417(A) |
申请公布日期 |
2002.01.09 |
申请号 |
KR20000036130 |
申请日期 |
2000.06.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JUNG, U SEOK;KIM, BONG SU;SHIN, DONG SEOK |
分类号 |
H01L21/20;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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地址 |
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