发明名称 TEMPERATURE MEASURING DEVICE AND TEMPERATURE MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To measure the temperature of a silicon fused liquid 1 in an infrared image furnace 2 having a halogen lamp 8 as a heating source and growing a silicon single crystal by a floating zone fusing method from the irradiated light of the silicon fused liquid 1 with high precision. SOLUTION: The light going in a specific direction from the silicon fused liquid 1 can be extracted by inserting an optical path tube 3 extending toward the silicon fused liquid 1, thereby the irradiated light from the silicon fused liquid 1 can be extracted by reducing the effect of the incident disturbance light from various directions such as the irradiated light from the halogen lamp 8 and its reflected light and scattered light. The luminance of the extracted light is measured by a CCD(charge coupled device) camera 7, and the temperature is determined from the luminance, thus the temperature can be measured by this simple-structure measuring device with high precision.
申请公布号 JP2002005745(A) 申请公布日期 2002.01.09
申请号 JP20000191441 申请日期 2000.06.26
申请人 NEC CORP 发明人 AZAMI TAKEFUMI
分类号 G01J5/06;C30B13/00;C30B13/22;C30B13/28;G01J5/00;G01J5/02;G01J5/04;G01J5/08;G01J5/10;(IPC1-7):G01J5/06 主分类号 G01J5/06
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