发明名称 Thermal control for a test and measurement instrument
摘要 A cooling system for a test and measurement instrument including a variable-speed fan, useful with different instruments having different configurations, employs a plurality of sensors disposed at predetermined locations within an enclosure of the instrument, and is software programmable with predetermined parameters of each particular configuration of each particular instrument. At least one of the sensors measures the temperature of a component that dissipates power at a substantially constant rate, and at least one of the sensors does not include a heat source to provide heat for measurement.
申请公布号 US6336592(B1) 申请公布日期 2002.01.08
申请号 US19990458490 申请日期 1999.12.09
申请人 TEKTRONIX, INC. 发明人 RUSSELL BRIAN G.;KREITZER ROBERT R.;COLEMAN CHRISTOPHER R.;HETKE THEODORE S.
分类号 F04D27/00;F04B49/06;G05D23/00;G06F1/20;H02P29/00;H05K7/20;(IPC1-7):F24F7/00 主分类号 F04D27/00
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