发明名称 Surface preparation method and semiconductor device
摘要 A surface preparation method and semiconductor device constituted so as to enable the prevention of carrier accumulation resulting from Si acting as a donor, without making the constitution of a semiconductor manufacturing apparatus complex. When forming an epitaxial layer either on the surface of a substrate, or on the surface of a base layer, Si or an Si compound that exists on the surface of a substrate, or on the surface of a base layer, is removed in accordance with a thermal cleaning process that uses an As hydride gas as the cleaning gas.
申请公布号 US6336970(B1) 申请公布日期 2002.01.08
申请号 US19990415459 申请日期 1999.10.14
申请人 DOWA MINING CO., LTD. 发明人 SAKAMOTO RYO;TOBA RYUICHI;IKEDA HIROYUKI
分类号 H01L21/302;H01L21/205;H01L21/306;H01L21/3065;(IPC1-7):C30B25/16 主分类号 H01L21/302
代理机构 代理人
主权项
地址