发明名称 Semiconductor device having directionally balanced gates and manufacturing method
摘要 A semiconductor device such as an IGBT having trench gates in a form of stripes, and manufacturing method, wherein concentration of stresses in only a single direction is relieved and the generation of a leakage current and crystal defects in the IGBT is prevented. In one embodiment, the inside of a terminal area of an IGBT is divided into a single gate pad area and plural element areas by a wiring area. The respective element areas are arranged in such a manner that the directions of trench gates formed in the respective element areas cross at right angles with respect to the directions of trench gates of respective adjacent element areas.
申请公布号 US6337498(B1) 申请公布日期 2002.01.08
申请号 US19990249296 申请日期 1999.02.12
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HASEGAWA SHIGERU;MATSUDA HIDEO;BABA YOSHIRO;TSUCHITANI MASANOBU
分类号 H01L29/78;H01L29/423;H01L29/739;H01L29/74;(IPC1-7):H01L29/94;H01L31/113 主分类号 H01L29/78
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