发明名称 Method for fabricating a group III nitride semiconductor device
摘要 A group III nitride semiconductor device producing method is constructed by: a step of forming a first crystal layer made of a group III nitride semiconductor (AlxGa1-x)1-y.InyN (0<=x<=1, 0<=y<=1) doped with a group II impurity element; a step of a second crystal layer made of a group III nitride semiconductor AlzGa1-zN (0.7<=z<=1) onto the first crystal layer; and a step of removing at least a part of the second crystal layer by etching after the formation of the first and second crystal layers.
申请公布号 US6335218(B1) 申请公布日期 2002.01.01
申请号 US20000565025 申请日期 2000.05.05
申请人 PIONEER CORPORATION 发明人 OTA HIROYUKI;MIYACHI MAMORU;KIMURA YOSHINORI
分类号 H01L21/205;H01L33/06;H01L33/32;H01L33/44;H01S5/00;H01S5/323;H01S5/343;(IPC1-7):H01L21/00 主分类号 H01L21/205
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