发明名称 |
Method for fabricating a group III nitride semiconductor device |
摘要 |
A group III nitride semiconductor device producing method is constructed by: a step of forming a first crystal layer made of a group III nitride semiconductor (AlxGa1-x)1-y.InyN (0<=x<=1, 0<=y<=1) doped with a group II impurity element; a step of a second crystal layer made of a group III nitride semiconductor AlzGa1-zN (0.7<=z<=1) onto the first crystal layer; and a step of removing at least a part of the second crystal layer by etching after the formation of the first and second crystal layers.
|
申请公布号 |
US6335218(B1) |
申请公布日期 |
2002.01.01 |
申请号 |
US20000565025 |
申请日期 |
2000.05.05 |
申请人 |
PIONEER CORPORATION |
发明人 |
OTA HIROYUKI;MIYACHI MAMORU;KIMURA YOSHINORI |
分类号 |
H01L21/205;H01L33/06;H01L33/32;H01L33/44;H01S5/00;H01S5/323;H01S5/343;(IPC1-7):H01L21/00 |
主分类号 |
H01L21/205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|