| 摘要 |
A method and apparatus to enable observation of an electron beam image of a specimen surface with an electron beam being always in focus in a convergent charged particle beam apparatus. Using an optical height detection system which does not cause interference with the electron beam, a specimen surface height in the vicinity of an electron beam irradiating point on the specimen surface is detected, and the specimen surface height is adjusted while the electron beam image of the specimen surface is being observed. The optical height detection system is calibrated using a calibration specimen having known step pattern features, and a surface height of an object under inspection is calculated accordingly. In the optical height detection system, a light beam is projected onto a surface of the object under inspection at an angle of at least 60 degrees with respect to a normal line on the surface of the object and a reflected light beam therefrom is detected for attaining surface height data of the object under inspection.
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