发明名称 Semiconductor device having a mark section and a dummy pattern
摘要 A semiconductor device includes a plurality of real chip regions and dicing lines to separate the real chip regions on a semiconductor substrate. A dicing line includes a mark section and a mark forbidden region around the mark section. A dummy wiring pattern is formed to fill the dicing line or a portion of the real chip region to surround the mark section and the mark forbidden region. A dummy wiring pattern may be a single continuous wiring pattern or the single wiring pattern may be divided into segments. Alternatively, a dummy wiring pattern may be composed of a plurality of square portions arranged in a matrix fashion.
申请公布号 US6335560(B1) 申请公布日期 2002.01.01
申请号 US19990457525 申请日期 1999.12.09
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 TAKEUCHI MASAHIKO
分类号 H01L23/52;H01L21/301;H01L21/3205;H01L21/321;H01L23/544;(IPC1-7):H01L23/544;H01L29/06 主分类号 H01L23/52
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