发明名称 Gas chemistry cycling to achieve high aspect ratio gapfill with HDP-CVD
摘要 A method and apparatus are disclosed for depositing a dielectric film in a gap having an aspect ratio at least as large as 6:1. By cycling the gas chemistry of a high-density-plasma chemical-vapor-deposition system between deposition and etching conditions, the gap may be substantially 100% filled. Such filling is achieved by adjusting the flow rates of the precursor gases such that the deposition to sputtering ratio during the deposition phases is within certain predetermined limits.
申请公布号 US6335288(B1) 申请公布日期 2002.01.01
申请号 US20000648395 申请日期 2000.08.24
申请人 APPLIED MATERIALS, INC. 发明人 KWAN MICHAEL;LIU ERIC
分类号 H01L21/205;C23C16/04;C23C16/44;C23C16/455;C23C16/517;C23C16/52;H01L21/3065;H01L21/316;H01L21/76;H01L21/8242;H01L27/108;(IPC1-7):H01L21/311;H01L21/469;C23C8/00 主分类号 H01L21/205
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