发明名称 Semiconductor memory device including spare memory cell
摘要 A redundancy row decoder in a DRAM includes a plurality of N channel MOS transistors connected in series between one terminal of each fuse and a line of a ground potential, the plurality of N channel MOS transistors having their gates receiving a predecode signal allocated to a corresponding word line. As compared with a conventional case where only one N channel MOS transistor is connected between one terminal of each fuse and the line of the ground potential, leakage current flowing through each fuse is made smaller.
申请公布号 US6335886(B1) 申请公布日期 2002.01.01
申请号 US20000725149 申请日期 2000.11.29
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 OCHI TAKEHIRO;KOBASHI HISAO
分类号 G06F12/16;G11C11/401;G11C11/408;G11C29/00;G11C29/04;(IPC1-7):G11C7/00 主分类号 G06F12/16
代理机构 代理人
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