发明名称 Semiconductor device cleave initiation
摘要 The present invention relates to a method of etching a semiconductor wafer (100), particularly of a compound semiconductor, in order to facilitate cleaving of devices (200) from the wafer (100) , and to devices (200) cleaved by such a method. A semiconductor device (200) is cleaved from a wafer (100) and comprises a substrate (106) and grown upon the substrate (106) one or more layers (108, 110, 112, 116, 122) , the cleaves (150, 151, 153, 154) thereby defining two pairs of parallel edges (201, 202; 203; 204) of the device (200). Each of the cleaves is guided by a groove (163, 164; 166, 266) etched through the grown layers (108, 110, 112, 116, 122) and partly into the substrate (106).
申请公布号 US6335559(B1) 申请公布日期 2002.01.01
申请号 US19990349253 申请日期 1999.07.08
申请人 HEWLETT-PACKARD COMPANY 发明人 CHARLES PAUL MARSHALL
分类号 H01L21/306;H01L21/301;H01L21/78;H01L31/18;H01L33/00;H01S5/02;(IPC1-7):H01L23/48 主分类号 H01L21/306
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