APPARATUS AND METHOD FOR TESTING ANALOG-DIGITAL CONVERTER AND DIGITAL-ANALOG CONVERTER,申请号KR20000033582-传众专利搜索

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发明名称	APPARATUS AND METHOD FOR TESTING ANALOG-DIGITAL CONVERTER AND DIGITAL-ANALOG CONVERTER
摘要
申请公布号	KR20010113298(A)	申请公布日期	2001.12.28
申请号	KR20000033582	申请日期	2000.06.19
申请人	HYNIX SEMICONDUCTOR INC.	发明人	BAE, JONG HONG
分类号	G01R31/28;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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